Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip - nuovo livro

EAN (ISBN-13): 9781461422969
ISBN (ISBN-10): 1461422965
Ano de publicação: 2012
Editor/Editora: Springer New York
187 Páginas
Língua: eng/Englisch

Livro na base de dados desde 2012-08-26T14:23:37-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2023-10-21T13:54:34-03:00 (Sao Paulo)
Número ISBN/EAN: 1461422965

Número ISBN - Ortografia alternativa:
1-4614-2296-5, 978-1-4614-2296-9
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: josé silva, jose silva, martinez, martí josé, jose marti, ona
Título do livro: around the circuit, chip, analog circuit design, variation, design systems, process design

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Dados da editora

Autor: Marvin Onabajo; Jose Silva-Martinez
Título: Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip
Editora: Springer; Springer US
174 Páginas
Ano de publicação: 2012-03-08
New York; NY; US
Impresso / Feito em
Língua: Inglês
96,29 € (DE)
99,00 € (AT)
118,00 CHF (CH)
Available
XVIII, 174 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Analog performance tuning; Built-in Testing; Digitally-assisted performance tuning; Mismatch Reduction; On-chip measurement circuits; System on Chip; Variation-Tolerant Analog Circuit Design; B; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Processor Architectures; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Processor Architectures; Engineering; Elektronik; Rechnerarchitektur und Logik-Entwurf; BB

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.    Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;Includes built-in testing techniques, linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.