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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suné, Giuseppe LaRosa, Stewart E. Rauch, III, Timothy D. Sullivan
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Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suné, Giuseppe LaRosa, Stewart E. Rauch, III, Timothy D. Sullivan:

Reliability Wearout Mechanisms in Advanced CMOS Technologies - encadernada, livro de bolso

2009, ISBN: 9780471731726

It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent t… mais…

100.0, Zahlungsarten: Paypal, APPLE_PAY, Google Pay, Visa, Mastercard, American Express. Custos de envio:Versand zum Fixpreis, [SHT: Standardversand], 22*** Hamburg, [TO: Weltweit] (EUR 5.50) booksof_22
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.
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Strong, Alvin W.|Wu, Ernest Y.|Vollertsen, Rolf-Peter|Sune, Jordi|La Rosa, Giuseppe|Sullivan, Timothy D.|Rauch, Stewart E.:

Reliability Wearout Mechanisms in Advanced CMOS Technologies - encadernada, livro de bolso

2009, ISBN: 0471731722

[EAN: 9780471731726], Neubuch, [PU: Wiley & Sons|Wiley-IEEE Press], TECHNOLOGY & INDUSTRIAL ARTS ENGINEERING ELECTRICAL TECHNIK ELEKTRONIK ELEKTROTECHNIK NACHRICHTENTECHNIK TECHNISCHE ZUV… mais…

NEW BOOK. Custos de envio:Versandkostenfrei. (EUR 0.00) moluna, Greven, Germany [73551232] [Rating: 5 (von 5)]
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch
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Alvin W. Strong Ernest Y. Wu Rolf-Peter Vollertsen Jordi Sune Giuseppe La Rosa Timothy D. Sullivan Stewart E. Rauch:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - primeira edição

2009

ISBN: 9780471731726

Edição encadernada

[ED: Gebunden], [PU: John Wiley & Sons], ALVIN W. STRONG, PhD, is retired from IBM in Essex Junction, Vermont. He holds nineteen patents, has authored or coauthored a number of papers, an… mais…

Custos de envio:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) Moluna GmbH
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Strong, Alvin W, and Wu, Ernest Y, and Vollertsen, Rolf-Peter:
Reliability Wearout Mechanisms in Advanced Cmos Technologies - encadernada, livro de bolso

2009, ISBN: 9780471731726

Hard cover, New Book Original US edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed., Brand New, [PU: Wiley-IEEE Press]

IND - IndienCustos de envio:mais custos de envio New Delhi, NEW DELHI, Firstbookstore
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa
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Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - encadernada, livro de bolso

2009, ISBN: 9780471731726

Buch, Hardcover, [PU: Wiley-IEEE Press], Wiley-IEEE Press, 2009

Custos de envio:Versand in 10-15 Tagen. (EUR 0.00)

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Reliability Wearout Mechanisms in Advanced CMOS Technologies

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

Dados detalhados do livro - Reliability Wearout Mechanisms in Advanced CMOS Technologies


EAN (ISBN-13): 9780471731726
ISBN (ISBN-10): 0471731722
Livro de capa dura
Livro de bolso
Ano de publicação: 2009
Editor/Editora: Wiley-IEEE Press
624 Páginas
Peso: 0,980 kg
Língua: eng/Englisch

Livro na base de dados desde 2007-07-05T02:08:40-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2024-03-08T11:28:43-03:00 (Sao Paulo)
Número ISBN/EAN: 9780471731726

Número ISBN - Ortografia alternativa:
0-471-73172-2, 978-0-471-73172-6
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: rosa peter, guiseppe, peter rauch, stewart, peter spain, rosa giuseppe, vollertsen rolf, volle, strong, vollert
Título do livro: cmos technologie, reliability for the technologies, series advanced, reliability wearout mechanisms advanced cmos technologies


Dados da editora

Autor: Alvin W. Strong; Ernest Y. Wu; Rolf-Peter Vollertsen; Jordi Sune; Giuseppe La Rosa; Timothy D. Sullivan; Stewart E. Rauch
Título: IEEE Press Series on Microelectronic Systems; Reliability Wearout Mechanisms in Advanced CMOS Technologies
Editora: John Wiley & Sons
624 Páginas
Ano de publicação: 2009-09-04
Peso: 0,966 kg
Língua: Inglês
165,00 € (DE)
No longer receiving updates
164mm x 238mm x 33mm

BB; gebunden; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Quality & Reliability; Schaltkreise - Theorie u. Entwurf; Circuit Theory & Design; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI; Electrical & Electronics Engineering; CMOS; Schaltkreistechnik; Circuit Theory & Design / VLSI / ULSI; Technische Zuverlässigkeit; Elektrotechnik u. Elektronik; Qualität u. Zuverlässigkeit; Schaltkreise - Theorie u. Entwurf; Schaltkreise - Theorie u. Entwurf / VLSI / ULSI

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: * Introduction to Reliability * Gate Dielectric Reliability * Negative Bias Temperature Instability * Hot Carrier Injection * Electromigration Reliability * Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

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