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Total Least Squares and Errors-in-Variables Modeling - van Huffel, S. / Lemmerling, P. (Hgg.)
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van Huffel, S. / Lemmerling, P. (Hgg.):

Total Least Squares and Errors-in-Variables Modeling - encadernada, livro de bolso

2002, ISBN: 9781402004766

[ED: Hardcover], [PU: Springer Netherlands], In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-k… mais…

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Total Least Squares and Errors-in-Variables Modeling Analysis, Algorithms and Applications - Lemmerling, P. (Herausgeber); Huffel, S. van (Herausgeber)
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Lemmerling, P. (Herausgeber); Huffel, S. van (Herausgeber):

Total Least Squares and Errors-in-Variables Modeling Analysis, Algorithms and Applications - encadernada, livro de bolso

2002, ISBN: 1402004761

2002 Gebundene Ausgabe Algorithmus, Mathematik, Statistik, Algebra, Wahrscheinlichkeitsrechnung und Statistik, Angewandte Mathematik, Algorithmen und Datenstrukturen, CurveFitting; Esti… mais…

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Total Least Squares and Errors-in-Variables Modeling Analysis, Algorithms and Applications - Huffel, S. van (Herausgeber); Lemmerling, P. (Herausgeber)
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Huffel, S. van (Herausgeber); Lemmerling, P. (Herausgeber):
Total Least Squares and Errors-in-Variables Modeling Analysis, Algorithms and Applications - encadernada, livro de bolso

2002

ISBN: 1402004761

2002 Gebundene Ausgabe Algorithmus, Mathematik, Statistik, Algebra, Wahrscheinlichkeitsrechnung und Statistik, Angewandte Mathematik, Theoretische Informatik, Curve fitting; Estimator; … mais…

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Total Least Squares and Errors-in-Variables Modeling: Analysis, Algorithms and Applications - S. van Huffel
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S. van Huffel:
Total Least Squares and Errors-in-Variables Modeling: Analysis, Algorithms and Applications - encadernada, livro de bolso

ISBN: 9781402004766

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Total Least Squares and Errors-in-Variables Modeling - Sabine van Huffel; Philippe Lemmerling
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Sabine van Huffel; Philippe Lemmerling:
Total Least Squares and Errors-in-Variables Modeling - encadernada, livro de bolso

2002, ISBN: 9781402004766

Analysis, Algorithms and Applications, 2002 ed., Hardcover, Buch, [PU: Springer-Verlag New York Inc.]

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Total Least Squares and Errors-in-Variables Modeling

In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems.

Dados detalhados do livro - Total Least Squares and Errors-in-Variables Modeling


EAN (ISBN-13): 9781402004766
ISBN (ISBN-10): 1402004761
Livro de capa dura
Ano de publicação: 2002
Editor/Editora: Springer-Verlag New York Inc.
412 Páginas
Peso: 0,777 kg
Língua: eng/Englisch

Livro na base de dados desde 2007-10-09T03:03:32-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2023-03-22T16:49:59-03:00 (Sao Paulo)
Número ISBN/EAN: 9781402004766

Número ISBN - Ortografia alternativa:
1-4020-0476-1, 978-1-4020-0476-6
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: philippe, van huffel, lemmerling, lemmer, lemme
Título do livro: analysis algorithms, error analysis, about squares, total


Dados da editora

Autor: S. van Huffel; P. Lemmerling
Título: Total Least Squares and Errors-in-Variables Modeling - Analysis, Algorithms and Applications
Editora: Springer; Springer Netherland
398 Páginas
Ano de publicação: 2002-02-28
Dordrecht; NL
Peso: 1,660 kg
Língua: Inglês
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
X, 398 p.

BB; Algebra; Hardcover, Softcover / Mathematik/Arithmetik, Algebra; Algebra; Verstehen; Analysis; Curve fitting; Estimator; Fitting; Matrix; Measure; algebra; algorithms; best fit; modeling; matrix theory; Linear and Multilinear Algebras, Matrix Theory; Statistics, general; Applications of Mathematics; Numeric Computing; Algorithms; Algebra; Linear Algebra; Statistics; Applications of Mathematics; Numerical Analysis; Algorithms; Wahrscheinlichkeitsrechnung und Statistik; Angewandte Mathematik; Numerische Mathematik; Algorithmen und Datenstrukturen; BC; EA

Preface. Introduction to Total Least Squares and Errors-in-Variables Modeling; S. Van Huffel, P. Lemmerling. Part I: Basic Concepts and Analysis in EIV Modeling. TLS and its Improvements by Semiparametric Approach; S. Amari, M. Kawanabe. Unifying Least Squares, Total Least Squares and Data Least Squares; C.C. Paige, Z. Strakos. Bounds for the Least Squares Residual Using Scaled TLS; C.C. Paige, Z. Strakos. Part II: Total Least Squares Algorithms. Recent Developments in Rank Revealing and Lanczos Methods for Total Least Squares Related Problems; R.D. Fierro, P.C. Hansen. A Regularized Total Least Squares Algorithm; H. Guo, R.A. Renaut. The Parametric Quadratic Form Method for Solving TLS Problems with Elementwise Weighting; A. Premoli, M.L. Rastello. Part III: Structured Total Least Squares Problems. Structured Total Least Squares: Analysis, Algorithms and Applications; P. Lemmerling, S. Van Huffel. Fast Structured Total Least Squares Algorithms via Exploitation of the Displacement Structure; N. Mastronardi, et al. The Extended STLS Algorithm for Minimizing the Extended LS Criterion; A. Yeredor. Part IV: Nonlinear EIV Models and Statistical Estimators. Bayesian Smoothing for Measurement Error Problems; S.M. Berry, et al. On the Polynomial Measurement Error Model; Chi-Lun Cheng, H. Schneeweiss. On Consistent Estimators in Nonlinear Functional EIV Models; A. Kukush, S. Zwanzig. On Consistent Estimators in Linear and Bilinear Multivariate Errors-in-Variables Models; A. Kukush, et al. Identification of Semi-Linear Models Within an Errors-in-Variables Framework; R. Pintelon, J. Schoukens. Cox's Proportional Hazards Model under Covariate Measurement Error; T. Augustin, R. Schwarz. Part V: EIV Modeling with Bounded Uncertainties. State-Space Estimation with Uncertain Models; A.H. Sayed, A. Subramanian. Models for Robust Estimation and Identification; S. Chandrasekaran, K. Schubert. Robust Solutions to Linear Approximation Problems Under Ellipsoidal Uncertainty; G.A. Watson. Part VI: Curve Fitting. QR Factorization of the Jacobian in Some Structured Nonlinear Least Squares Problems; Å. Björck. Neural Minor Component Analysis and TLS; G. Cirrincione, M. Cirrincione. On the Structural Line Segment Model; O. Davidov, et al. Model Fitting for Multiple Variables by Minimising the Geometric Mean Deviation; C. Tofallis. Part VII: EIV Estimation in System Identification. Perspectives on Errors-in-Variables Estimation for Dynamic Systems; T. Söderström, et al. Errors-in-Variables Filtering in Behavioural and State-Space Contexts, R. Guidorzi, et al. Weighted Total Least Squares, Rank Deficiency and Linear Matrix Structures; B. De Moor. Frequency-Domain TLS and GTLS Algorithms for Modal Analysis Applications; P. Verboven, et al. Part VIII: EIV Estimation in Signal Processing. A New Decimative Spectral Estimation Method with Unconstrained Model Order and Decimation Factor; S.-E. Fotinea, et al. Modeling Audio with Damped Sinusoids Using Total Least Squares Algorithms; W. Verhelst, et al. Real-Time TLS Algorithms in Gaussian and Impulse Noise Environments; Da-Zeng Feng, et al. Part IX: EIV Applications in Other Fields. Efficient Computation of the Riemannian SVD in Total Least Squares Problems in Information Retrieval; R.D. Fierro, M.W. Berry. Constrained Total Least Squares for Color Image Reconstructio

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