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Handbook of Microscopy, Handbook of Microscopy : Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II - Thomas Bauschert
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Thomas Bauschert:

Handbook of Microscopy, Handbook of Microscopy : Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II - nuovo livro

ISBN: 9783527620531

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the ph… mais…

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Handbook of Microscopy
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Handbook of Microscopy - nuovo livro

ISBN: 9783527620531

*Handbook of Microscopy* - Applications in Materials Science Solid-State Physics and Chemistry. Methods II / pdf eBook für 304.99 € / Aus dem Bereich: eBooks, Fachthemen & Wissenschaft, W… mais…

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Handbook of Microscopy - S. Amelinckx; Dirk van Dyck; J. van Landuyt; Gustaaf van Tendeloo
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S. Amelinckx; Dirk van Dyck; J. van Landuyt; Gustaaf van Tendeloo:
Handbook of Microscopy - primeira edição

2008

ISBN: 9783527620531

Applications in Materials Science, Solid-State Physics, and Chemistry, Methods II, eBooks, eBook Download (PDF), Auflage, [PU: Wiley-VCH], [ED: 1], Wiley-VCH, 2008

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Handbook of Microscopy - S. Amelinckx; Dirk van Dyck; J. van Landuyt; Gustaaf van Tendeloo
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S. Amelinckx; Dirk van Dyck; J. van Landuyt; Gustaaf van Tendeloo:
Handbook of Microscopy - primeira edição

2008, ISBN: 9783527620531

Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II, eBooks, eBook Download (PDF), 1. Auflage, [PU: Wiley-VCH], Wiley-VCH, 2008

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ISBN: 9783527620531

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Handbook of Microscopy
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9783527620531

Dados detalhados do livro - Handbook of Microscopy


EAN (ISBN-13): 9783527620531
ISBN (ISBN-10): 3527620532
Ano de publicação: 2008
Editor/Editora: Wiley-VCH GmbH
507 Páginas
Língua: eng/Englisch

Livro na base de dados desde 2007-01-17T18:44:36-02:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2023-09-27T23:08:30-03:00 (Sao Paulo)
Número ISBN/EAN: 9783527620531

Número ISBN - Ortografia alternativa:
3-527-62053-2, 978-3-527-62053-1
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: markus wolf, van dyck, amelin, amelinckx
Título do livro: solid state physics, handbook chemistry and physics, applications chemistry, handbook microscopy applications materials science

Dados da editora

Autor: S. Amelinckx
Título: Handbook of Microscopy - Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II
Editora: Wiley-VCH; Wiley-VCH
482 Páginas
Ano de publicação: 2008-07-11
Língua: Inglês
304,99 € (DE)

EA; E107; E-Book; Nonbooks, PBS / Chemie; Materialwissenschaft; Verstehen; Analytical Chemistry; Analytische Chemie; Chemie; Chemistry; Dünne Schichten, Oberflächen u. Grenzflächen; Festkörperchemie; Festkörperphysik; Materials Characterization; Materials Science; Materialwissenschaften; Physics; Physik; Physik, Astronomie / Elektrizität, Magnetismus, Optik; Solid State Chemistry; Solid State Physics; Thin Films, Surfaces & Interfaces; Werkstoffprüfung; Analytische Chemie; Festkörperchemie; Allg. Materialwissenschaften; Dünne Schichten, Oberflächen u. Grenzflächen; Werkstoffprüfung; Festkörperphysik; BB

METHODS I: LIGHT MICROSCOPY Reflection Microscopy Transmission Microscopy Raman Microscopy Three-dimensional Light Microscopy Near Field Light Microscopy Infrared Microscopy X-RAY MICROSCOPY Soft X-ray Imaging X-ray Microradiography X-ray Microtomography X-ray Holographic Imaging X-ray Topography ACOUSTIC MICROSCOPY Scanning Acoustic Microscopy Photoacoustic Microscopy Electron Acoustic Microscopy Scanning Laser Acoustic Microscopy ELECTRON MICROSCOPY Stationary Beam Methods METHODS II: ELECTRON MICROSCOPY Scanning Beam Methods Magnetic Methods: NMR-Microscopy Scanning Electron Microscopy with Polarization Analysis (SEMPA) EMISSION METHODS Photoemission Electron Microscopy Field Emission Microscopy (FEM) Field Ion Microscopy SCANNING POINT PROBE TECHNIQUES Scanning Tunnelling Microscopy STM Atomic Force Microscopy AFM Magnetic Force Microscopy MFM Ballistic Electron Emission Microscopy (BEEM) Methods Under Development IMAGE RECORDING HANDLING AND PROCESSING Electronic Image Recording Image Processing SPECIAL TOPICS Coincidence Microscopy Low Energy Holography APPLICATIONS: CLASSES OF MATERIALS Metals and Alloys Rocks and Minerals Semiconductors and Semiconducting Devices Opto-electronic Materials Ferroic Materials Structural Ceramics Gemmological Applications Superconductors: Intermetallics and Ceramics Nonperiodic Structures Dental and Biomaterials Application of TEM and SAED Different Forms of Carbon Composite Structural Materials Polymers Nuclear Materials Magnetic Materials SPECIAL TOPICS Phase Transformations Specimen Preparation Techniques Environmental Problems Thin Film Growth Quantitative Hyleography
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