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Advanced Test Methods for SRAMs - Alberto Bosio & Luigi Dilillo & Patrick Girard & Serge Pravossoudovitch & Arnaud Virazel
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Alberto Bosio & Luigi Dilillo & Patrick Girard & Serge Pravossoudovitch & Arnaud Virazel:

Advanced Test Methods for SRAMs - nuovo livro

ISBN: 9781441909381

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the tec… mais…

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Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel:

Advanced Test Methods for SRAMs - nuovo livro

2009, ISBN: 9781441909381

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, eBooks, eBook Download (PDF), 2010, Modern electronics depend on nanoscaled technologies that present new chall… mais…

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Advanced Test Methods for SRAMs - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for SRAMs - nuovo livro

ISBN: 1441909389

Advanced Test Methods for SRAMs ab 106.99 € als pdf eBook: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Comp… mais…

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Advanced Test Methods For Srams - Bosio
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Advanced Test Methods For Srams - livro usado

ISBN: 9781441909381

A digital copy of "Advanced Test Methods For Srams" by Bosio. Download is immediately available upon purchase! 9781441909381,1441909389,advanced,test,methods,srams,bosio eBook, Vitalsour… mais…

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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
Advanced Test Methods for SRAMs - nuovo livro

ISBN: 9781441909381

*Advanced Test Methods for SRAMs* - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / pdf eBook für 96.49 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Co… mais…

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Advanced Test Methods for SRAMs
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1441909389

Dados detalhados do livro - Advanced Test Methods for SRAMs


EAN (ISBN-13): 9781441909381
ISBN (ISBN-10): 1441909389
Ano de publicação: 2009
Editor/Editora: Springer US
171 Páginas
Língua: eng/Englisch

Livro na base de dados desde 2010-02-23T14:29:29-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2023-08-11T03:36:07-03:00 (Sao Paulo)
Número ISBN/EAN: 1441909389

Número ISBN - Ortografia alternativa:
1-4419-0938-9, 978-1-4419-0938-1
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: serge, bosio, girard patrick, arnaud
Título do livro: test, advanced method, sram

Dados da editora

Autor: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
Título: Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Editora: Springer; Springer US
171 Páginas
Ano de publicação: 2009-10-08
New York; NY; US
Língua: Inglês
96,29 € (DE)
99,00 € (AT)
118,00 CHF (CH)
Available
XV, 171 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testing; Technologie; currmssc; design; diagnosis; electronics; semiconductor; technology; testing; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BC

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
First book to present complete, state-of-the-art coverage of dynamic fault memory testing Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.) Includes Spice simulation files and an SRAM logic fault simulator Includes supplementary material: sn.pub/extras
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