ISBN: 1860941591

[SR: 2499265], Gebundene Ausgabe, [EAN: 9781860941597], World Scientific Pub Co (, World Scientific Pub Co (, Book, [PU: World Scientific Pub Co (], World Scientific Pub Co (, 60537011, H… mais…

[SR: 2499265], Gebundene Ausgabe, [EAN: 9781860941597], World Scientific Pub Co (, World Scientific Pub Co (, Book, [PU: World Scientific Pub Co (], World Scientific Pub Co (, 60537011, Halbleiter, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56051011, Kristallografie, 56048011, Chemie, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56375011, Physik, 56376011, Akustik & Schall, 56427011, Angewandte Physik, 56429011, Astrophysik & Raumforschung, 56428011, Biophysik, 56270011, Chaos & Systeme, 56090011, Chemische Physik, 56378011, Dynamik, 56414011, Elektromagnetismus, 56383011, Energie, 56422011, Entropie, 56398011, Festkörperphysik, 56127011, Geophysik, 56404011, Kernphysik, 56377011, Kosmologie, 56386011, Licht, 56421011, Maschinenbau & Technik, 56272011, Mathematische Physik, 56389011, Mechanik, 56390011, Molekularphysik, 56391011, Nanostrukturen, 56392011, Optik, 56397011, Quantentheorie, 56393011, Relativität, 56385011, Schwerkraft, 1320310031, Statik, 56395011, Systemtheorie, 56396011, Wellen & Wellenmechanik, 56201011, Zeit, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 208622031, Gebundene Ausgabe, 208621031, Format (binding_browse-bin), 366250011, Refinements, 52044011, Fremdsprachige Bücher<

ISBN: 9781860941597

X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback me… mais…

X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors. X-Ray Scattering from Semiconductors Fewster, Paul F., World Scientific Publishing Company<

2000, ISBN: 9781860941597

Imperial College Press, Hardcover, 304 Seiten, Publiziert: 2000-12-13T00:00:01Z, Produktgruppe: Book, 0.57 kg, Books Global Store, Special Features, Books, Physical Chemistry, Chemistry, … mais…

Imperial College Press, Hardcover, 304 Seiten, Publiziert: 2000-12-13T00:00:01Z, Produktgruppe: Book, 0.57 kg, Books Global Store, Special Features, Books, Physical Chemistry, Chemistry, Science, Nature & Maths, Subjects, Electronics Engineering, Electronics & Communications Engineering, Engineering & Technology, Engineering Physics, Materials Science, Mechanical & Materials Engineering, States of Matter, Popular Science, Electronics & Telecommunications Engineering, Scientific, Technical & Medical, Mechanical & Material Engineering, Imperial College Press, 2000<