Two-dimensional X-ray Diffraction - nuovo livro

EAN (ISBN-13): 9780470227220
ISBN (ISBN-10): 0470227222
Livro de capa dura
Ano de publicação: 2009
Editor/Editora: Wiley
426 Páginas
Peso: 0,721 kg
Língua: eng/Englisch

Livro na base de dados desde 2009-09-27T08:57:12-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2022-06-28T10:40:11-03:00 (Sao Paulo)
Número ISBN/EAN: 9780470227220

Número ISBN - Ortografia alternativa:
0-470-22722-2, 978-0-470-22722-0
Ortografia alternativa e termos de pesquisa relacionados:
Título do livro: ray

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Dados da editora

Autor: B. B. He
Título: Two-dimensional X-ray Diffraction
Editora: John Wiley & Sons
426 Páginas
Ano de publicação: 2009-09-04
Peso: 0,710 kg
Língua: Inglês
165,00 € (DE)
No longer receiving updates
164mm x 239mm x 24mm

BB; Hardcover, Softcover / Chemie; Analytische Chemie; Analytical Chemistry; Analytische Chemie; Chemie; Chemistry; Materials Science; Materialwissenschaften; Pharmaceutical & Medicinal Chemistry; Pharmazeutische u. Medizinische Chemie; Röntgenbeugung; Analytische Chemie; Pharmazeutische u. Medizinische Chemie; Allg. Materialwissenschaften

Preface. 1. Introduction. 1.1 X-Ray Technology and Its Brief History. 1.2 Geometry of Crystals. 1.3 Principles of X-Ray Diffraction. 1.4 Reciprocal Space and Diffraction. 1.5 Two-Dimensional X-Ray Diffraction. 2. Geometry Conventions. 2.1 Introduction. 2.2 Diffraction Space and Laboratory Coordinates. 2.3 Detector Space and Detector Geometry. 2.4 Sample Space and Goniometer Geometry. 2.5 Transformation from Diffraction Space to Sample Space. 2.6 Summary of XRD2 Geometry. References. 3. X-Ray Source and Optics. 3.1 X-Ray Generation and Characteristics. 3.2 X-Ray Optics. References. 4. X-Ray Detectors. 4.1 History of X-Ray Detection Technology. 4.2 Point Detectors in Conventional Diffractometers. 4.3 Characteristics of Point Detectors. 4.4 Line Detectors. 4.5 Characteristics of Area Detectors. 4.6 Types of Area Detectors. 5. Goniometer and Sample Stages. 5.1 Goniometer and Sample Position. 5.2 Goniometer Accuracy. 5.3 Sample Alignment and Visualization Systems. 5.4 Environment Stages. References. 6. Data Treatment. 6.1 Introduction. 6.2 Nonuniform Response Correction. 6.3 Spatial Correction. 6.4 Detector Position Accuracy and Calibration. 6.5 Frame Integration. 6.6 Lorentz, Polarization, and Absorption Corrections. 7. Phase Identification. 7.1 Introduction. 7.2 Relative Intensity. 7.3 Geometry and Resolution. 7.4 Sampling Statistics. 7.5 Preferred Orientation Effect. References. 8. Texture Analysis. 8.1 Introduction. 8.2 Pole Density and Pole Figure. 8.3 Fundamental Equations. 8.4 Data Collection Strategy. 8.5 Texture Data Process. 8.6 Orientation Distribution Function. 8.7 Fiber Texture. 8.8 Other Advantages of XRD2 for Texture. References. 9. Stress Measurement. 9.1 Introduction. 9.2 Principle of X-Ray Stress Analysis. 9.3 Theory of Stress Analysis with XRD2. 9.4 Process of Stress Measurement with XRD2. 9.5 Experimental Examples. Appendix 9.A Calculation of Principal Stresses from the General Stress Tensor. Appendix 9.B Parameters for Stress Measurement. References. 10. Small-Angle X-Ray Scattering. 10.1 Introduction. 10.2 2D SAXS Systems. 10.3 Application Examples. 10.4 Some Innovations in 2D SAXS. References. 11. Combinatorial Screening. 11.1 Introduction. 11.2 XRD2 Systems for Combinatorial Screening. 11.3 Combined Screening with XRD2 and Raman. 12. Quantitative Analysis. 12.1 Percent Crystallinity. 12.2 Crystal Size. 12.3 Retained Austenite. References. 13. Innovation and Future Development. 13.1 Introduction. 13.2 Scanning Line Detector for XRD2. 13.3 Three-Dimensional Detector. 13.4 Pixel Direct Diffraction Analysis. References. Appendix A. Values of Commonly Used Parameters. Appendix B. Symbols. Index.