Yield and Variability Optimization of Integrated Circuits - encadernada, livro de bolso

EAN (ISBN-13): 9780792395515
ISBN (ISBN-10): 0792395514
Livro de capa dura
Ano de publicação: 2007
Editor/Editora: Springer
256 Páginas
Peso: 0,555 kg
Língua: eng/Englisch

Livro na base de dados desde 2007-10-18T08:12:37-02:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2023-10-23T09:20:35-03:00 (Sao Paulo)
Número ISBN/EAN: 9780792395515

Número ISBN - Ortografia alternativa:
0-7923-9551-4, 978-0-7923-9551-5
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: cheng, jian, zhang
Título do livro: yield variability optimization integrated circuits, zhang jian

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Dados da editora

Autor: Jian Cheng Zhang; M.A. Styblinski
Título: Yield and Variability Optimization of Integrated Circuits
Editora: Springer; Springer US
234 Páginas
Ano de publicação: 1995-02-28
New York; NY; US
Língua: Inglês
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
Available
XVII, 234 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; circuit; integrated circuit; material; modeling; performance tuning; Electronic Circuits and Systems; Electrical and Electronic Engineering; Elektrotechnik; BC

1 Introduction.- 1.1 Design for Quality and Manufacturability.- 1.2 Notation.- 1.3 Interpretation of Basic Concepts.- 1.4 Summary.- 2 Overview of IC Statistical Modeling.- 2.1 Introduction.- 2.2 Process Variations.- 2.3 Environmental Variations.- 2.4 Statistical Macromodeling.- 2.5 Summary.- 3 Design of Experiments.- 3.1 Introduction.- 3.2 Experiment Analysis.- 3.3 Orthogonal Arrays.- 3.4 Main Effect Analysis.- 3.5 Interaction Analysis.- 3.6 Taguchi Experiments.- 3.7 Summary.- 4 Parametric Yield Maximization.- 4.1 Introduction.- 4.2 Yield Estimation.- 4.3 Indirect Yield Improvement.- 4.4 Direct Yield Optimization Methods.- 4.5 Generalized and Orthogonal Array-Based Gradient Methods for Discrete Circuits.- 4.6 Gradient Methods for Integrated Circuits.- 4.7 Examples.- 4.8 Summary.- 5 Variability Minimization and Tuning.- 5.1 Introduction.- 5.2 Principles of Discrete Circuit Variability Minimization.- 5.3 Principles of IC Variability Minimization.- 5.4 Factor Screening.- 5.5 Taguchi’s on-target Design.- 5.6 Two-Stage Design Strategy.- 5.7 Example 4: CMOS Delay Circuit.- 5.8 Example 5: CMOS Clock Driver.- 5.9 Summary.- 6 Worst-Case Measure Reduction.- 6.1 Introduction.- 6.2 The ±? Transistor Modeling.- 6.3 Worst-Case Measure Minimization.- 6.4 Comments on the ±? Model.- 6.5 Creation of Worst-Case Models From the Statistical Model.- 6.6 Summary.- 7 Multi-Objective Circuit Optimization.- 7.1 Introduction.- 7.2 Multiple-Objective Optimization: An Overview.- 7.3 Fuzzy Sets.- 7.4 Multiple-Performance Statistical Optimization.- 7.5 Multiple-Performance Variability Minimization.- 7.6 Summary.- References.