2010, ISBN: 9781441931672
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ISBN: 9781441931672
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine wheth… mais…
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2010, ISBN: 9781441931672
Mitwirkende: Naus, Joseph, Mitwirkende: Wallenstein, Sylvan, Springer New York, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2001, 392 Seiten, Publiziert: 2010-02-19T00:00… mais…
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2010, ISBN: 9781441931672
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2001, ISBN: 1441931678
Edição encadernada
Scan Statistics ab 149.99 € als Taschenbuch: Softcover reprint of hardcover 1st ed. 2001. Aus dem Bereich: Bücher, Taschenbücher, Naturwissenschaft, Springer New York
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2010, ISBN: 9781441931672
Edição encadernada
[ED: Softcover], [PU: Springer / Springer New York / Springer, Berlin], In many statistical applications, scientists have to analyze the occurrence of observed clusters of events in time … mais…
ISBN: 9781441931672
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine wheth… mais…
2010
ISBN: 9781441931672
Mitwirkende: Naus, Joseph, Mitwirkende: Wallenstein, Sylvan, Springer New York, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2001, 392 Seiten, Publiziert: 2010-02-19T00:00… mais…
2010, ISBN: 9781441931672
Edição encadernada
[ED: Kartoniert / Broschiert], [PU: Springer New York], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Applications to many areas of scie… mais…
2001, ISBN: 1441931678
Edição encadernada
Scan Statistics ab 149.99 € als Taschenbuch: Softcover reprint of hardcover 1st ed. 2001. Aus dem Bereich: Bücher, Taschenbücher, Naturwissenschaft, Springer New York
Dados bibliográficos do melhor livro correspondente
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Dados detalhados do livro - Scan Statistics (Springer Series in Statistics)
EAN (ISBN-13): 9781441931672
ISBN (ISBN-10): 1441931678
Livro de capa dura
Livro de bolso
Ano de publicação: 2010
Editor/Editora: Springer New York
392 Páginas
Peso: 0,591 kg
Língua: eng/Englisch
Livro na base de dados desde 2010-07-10T20:18:24-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2023-04-03T11:49:22-03:00 (Sao Paulo)
Número ISBN/EAN: 9781441931672
Número ISBN - Ortografia alternativa:
1-4419-3167-8, 978-1-4419-3167-2
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: nau, wallenstein, sylvan
Título do livro: wallenstein, statistics
Dados da editora
Autor: Joseph Glaz
Título: Springer Series in Statistics; Scan Statistics
Editora: Springer; Springer US
372 Páginas
Ano de publicação: 2010-12-06
New York; NY; US
Impresso / Feito em
Língua: Inglês
109,99 € (DE)
BC; Hardcover, Softcover / Mathematik/Wahrscheinlichkeitstheorie, Stochastik, Mathematische Statistik; Wahrscheinlichkeitsrechnung und Statistik; Verstehen; Poisson process; Random variable; Scan Statistics; calculus; clustering; statistics; Statistical Theory and Methods; Biostatistics; Statistics in Engineering, Physics, Computer Science, Chemistry and Earth Sciences; BB
I Methods and Applications.- 1 Introduction.- 2 Retrospective Scanning of Events Over Time.- 3 Prospective Scanning of Events Over Time.- 4 Success Scans in a Sequence of Trials.- 5 Higher-Dimensional Scans.- 6 Scan Statistics in DNA and Protein Sequence Analysis.- II Scan Distribution Theory and its Developments.- 7 Approaches Used for Derivations and Approximations.- 8 Scanning N Uniform Distributed Points: Exact Results.- 9 Scanning N Uniform Distributed Points: Bounds.- 10 Approximations for the Conditional Case.- 11 Scanning Points in a Poisson Process.- 12 The Generalized Birthday Problem.- 13 Scan Statistics for a Sequence of Discrete I.I.D. Variates.- 14 Power.- 15 Testing for Clustering.- 16 Two-Dimensional Scan Statistics.- 17 Number of Clusters: Ordered Spacings.- 18 Extensions of the Scan Statistic.- References.Outros livros adicionais, que poderiam ser muito similares com este livro:
Último livro semelhante:
9781475734607 Scan Statistics (Joseph Glaz; Joseph Naus; Sylvan Wallenstein)
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