2009, ISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… mais…
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ISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… mais…
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2015, ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Seiten: 527, Springer International Publishing, 2015
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2015, ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Springer International Publishing, 2015
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2015, ISBN: 9783319155883
Volume 3, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]
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2009, ISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… mais…
Ernst Meyer, Franz J. Giessibl, Roland Wiesendanger, Seizo Morita:
Noncontact Atomic Force Microscopy - nuovo livroISBN: 9783319155883
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic re… mais…
2015
ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Seiten: 527, Springer International Publishing, 2015
2015, ISBN: 9783319155883
Volume 3, eBooks, eBook Download (PDF), 2015, [PU: Springer International Publishing], Springer International Publishing, 2015
2015, ISBN: 9783319155883
Volume 3, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]
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Dados detalhados do livro - Noncontact Atomic Force Microscopy
EAN (ISBN-13): 9783319155883
ISBN (ISBN-10): 3319155881
Ano de publicação: 2009
Editor/Editora: Springer International Publishing
Livro na base de dados desde 2015-08-07T09:52:55-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2022-11-25T13:47:30-03:00 (Sao Paulo)
Número ISBN/EAN: 9783319155883
Número ISBN - Ortografia alternativa:
3-319-15588-1, 978-3-319-15588-3
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: ernst meyer, gies, ernst wies, wiese, roland wiesendanger, meyer franz
Dados da editora
Autor: Seizo Morita; Franz J. Giessibl; Ernst Meyer; Roland Wiesendanger
Título: NanoScience and Technology; Noncontact Atomic Force Microscopy - Volume 3
Editora: Springer; Springer International Publishing
527 Páginas
Ano de publicação: 2015-05-18
Cham; CH
Língua: Inglês
213,99 € (DE)
220,00 € (AT)
236,00 CHF (CH)
Available
XXII, 527 p. 256 illus., 159 illus. in color.
EA; E107; eBook; Nonbooks, PBS / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Atom Manipulation; Atomic Force Microscopy; Atomic Resolution; Atomic/Molecular Manipulation; Chemical Structure; Force Mapping with Atomic Resolution; Liquid AFM; Magnetic Exchange Force Microscopy; Scanning Probe Techniques; Scanning Tunneling Microscopy; B; Nanophysics; Surfaces, Interfaces and Thin Film; Spectroscopy; Nanotechnology; Chemistry and Materials Science; Nanowissenschaften; Materialwissenschaft; Spektroskopie, Spektrochemie, Massenspektrometrie; Nanotechnologie; BB
From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Includes supplementary material: sn.pub/extras
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