ISBN: 9783642093401
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural ste… mais…
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ISBN: 9783642093401
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural ste… mais…
Springer.com Nr. 978-3-642-09340-1. Custos de envio:Worldwide free shipping, , DE. (EUR 0.00) Details... |
2010, ISBN: 9783642093401
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2010, ISBN: 364209340X
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ISBN: 9783642093401
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural ste… mais…
ISBN: 9783642093401
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural ste… mais…
2010
ISBN: 9783642093401
[ED: Softcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied sc… mais…
2010, ISBN: 364209340X
Edição encadernada
Softcover reprint of hardcover 1st ed. 2008 Kartoniert / Broschiert Wissenschaftliche Ausstattung, Experimente und Techniken, Spektroskopie, Spektrochemie, Massenspektrometrie, Polymerc… mais…
2010, ISBN: 9783642093401
Livro de bolso
[ED: Kartoniert / Broschiert], [PU: Springer Berlin Heidelberg], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing th… mais…
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Dados detalhados do livro - Applied Scanning Probe Methods VIII
EAN (ISBN-13): 9783642093401
ISBN (ISBN-10): 364209340X
Livro de capa dura
Livro de bolso
Ano de publicação: 2010
Editor/Editora: Springer Berlin
528 Páginas
Peso: 0,789 kg
Língua: eng/Englisch
Livro na base de dados desde 2011-01-20T15:06:07-02:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2024-03-17T06:27:13-03:00 (Sao Paulo)
Número ISBN/EAN: 9783642093401
Número ISBN - Ortografia alternativa:
3-642-09340-X, 978-3-642-09340-1
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: bhushan, harald fuchs, tomi, masahiko, tom hara
Título do livro: scanning probe microscopy nanoscience, applied methods, probe aufnahmen
Dados da editora
Autor: Bharat Bhushan; Harald Fuchs; Masahiko Tomitori
Título: NanoScience and Technology; Applied Scanning Probe Methods VIII - Scanning Probe Microscopy Techniques
Editora: Springer; Springer Berlin
465 Páginas
Ano de publicação: 2010-11-16
Berlin; Heidelberg; DE
Impresso / Feito em
Língua: Inglês
117,69 € (DE)
120,99 € (AT)
130,00 CHF (CH)
POD
LIX, 465 p.
BC; Hardcover, Softcover / Technik/Allgemeines, Lexika; Elektronik; Verstehen; AFM; Nanotube; PES; carbon nanotubes; ceramics; liquid; microscopy; polymer; Microsystems and MEMS; Spectroscopy; Surface and Interface and Thin Film; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; BB; EA
Background-Free Apertureless Near-Field Optical Imaging.- Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes.- Near Field Probes: From Optical Fibers to Optical Nanoantennas.- Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging.- Scanning Probes for the Life Sciences.- Self-Sensing Cantilever Sensor for Bioscience.- AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication.- Cantilever Spring-Constant Calibration in Atomic Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Kelvin Probe Force Microscopy: Recent Advances and Applications.- Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale.- Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.First book summarizing the state-of-the-art of this technique Real industrial applications included Includes supplementary material: sn.pub/extras
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