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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - S. Murti Sarma N., Vasantha Kumar Petta Veera Bala
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S. Murti Sarma N., Vasantha Kumar Petta Veera Bala:

Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Livro de bolso

ISBN: 3659713910

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - N. S. Murti Sarma
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N. S. Murti Sarma:

Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Livro de bolso

2015, ISBN: 3659713910

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - nuovo livro

ISBN: 9783659713910

The leakage power, power integrity challenges due to spare cells and peak IR drop respectively are addressed in this monograph. The scope of the solution proposed lies in the Physical des… mais…

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - N. S. Murti Sarma, Petta Veera Bala Vasantha Kumar
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N. S. Murti Sarma, Petta Veera Bala Vasantha Kumar:
Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - Livro de bolso

ISBN: 3659713910

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - S. Murti Sarma, N.; Vasantha Kumar, Petta Veera Bala
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S. Murti Sarma, N.; Vasantha Kumar, Petta Veera Bala:
Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop - nuovo livro

2015, ISBN: 3659713910

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Techniques to address Last Stage Leakage Recovery and Dynamic IR Drop
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9783659713910


The leakage power, power integrity challenges due to spare cells and peak IR drop respectively are addressed in this monograph. The scope of the solution proposed lies in the Physical design level near to design closure where optimization tools have tight resources to fix these challenges. However, there is a lot of scope for future work in other areas of low PM spectrum like at circuit level, architectural level, design level and software coding level. Majority of today's semiconductor designers are not moved to very recent techniques like gate array ECO flows using ECO kits provided by library vendors due to efforts involved in modifying existing flows and tight design schedules. The proposed "Optimal State Assignment" technique can help reducing spare cells leakage without affecting design flows but switching to these new techniques will help in complete leakage power reduction of spare cells. Another possible area for future investigation is to use 65nm, 45nm, 32nm and 28nm libraries for various data flow intensive architectures implementation to validate the proposed "Selective Glitch Reduction" technique.

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EAN (ISBN-13): 9783659713910
ISBN (ISBN-10): 3659713910
Livro de capa dura
Livro de bolso
Ano de publicação: 2015
Editor/Editora: OmniScriptum GmbH & Co. KG

Livro na base de dados desde 2015-07-14T08:04:29-03:00 (Sao Paulo)
Página de detalhes modificada pela última vez em 2024-01-11T04:27:47-03:00 (Sao Paulo)
Número ISBN/EAN: 9783659713910

Número ISBN - Ortografia alternativa:
3-659-71391-0, 978-3-659-71391-0
Ortografia alternativa e termos de pesquisa relacionados:
Autor do livro: sarma, murti
Título do livro: stage, recovery

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